%0 Journal Article
%T Crosstalk Induced Fault Analysis and Test in DRAMs
%A Yang, Zemo
%A Mourad, Samiha
%J Journal of Electronic Testing
%V 22
%N 2
%P 173-187
%@ 0923-8174
%D 2006-01-01
%I Kluwer Academic Publishers
%~ DeepDyve