%0 Journal Article
%T Methods of automatic testing the very large integrated circuit of memory
%A Smirnov, K.K.
%A Nazarov, A.V.
%A Blinov, V.V.
%J International Journal of Nanotechnology
%V 18
%N 9-10
%P 869-886
%@ 1475-7435
%D 2021-01-01
%I Inderscience Enterprises Ltd
%~ DeepDyve