%0 Journal Article %T Performance and reliability of N-type doping-free TFETs: the role of compound semiconductor materials %A Chandan, Bandi Venkata %A Nigam, Kaushal Kumar %J "Multiscale and Multidisciplinary Modeling, Experiments and Design" %V 8 %N 3 %@ 2520-8160 %D 2025-03-01 %I Springer International Publishing %~ DeepDyve