%0 Journal Article
%T Working group report of database construction of secondary electron yield
%A Suzuki, S.
%A Yurimoto, H.
%A Setou, M.
%A Nagatomi, T.
%A Etoh, T.G.
%A Fujii, Y.
%A Ikuta, T.
%A Saka, T.
%A Shimizu, R.
%A Tomita, M.
%A Hibino, H.
%A Kurokawa, A.
%A Suzuki, M.
%A Yanagiuchi, K.
%A Yoshikawa, H.
%A Kono, T.
%J Surface and Interface Analysis
%V 42
%N 10‐11
%P 1541-1543
%@ 0142-2421
%D 2010-10-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve