%0 Journal Article
%T Analysis of Difference in Areal Density Aluminum Equivalent Method in Ionizing Total Dose Shielding Analysis of Semiconductor Devices
%A Liu, Mingyu
%A He, Chengfa
%A Feng, Jie
%A Xun, Mingzhu
%A Sun, Jing
%A Li, Yudong
%A Guo, Qi
%J Electronics
%V 12
%N 19
%@ 2079-9292
%D 2023-10-09
%I Multidisciplinary Digital Publishing Institute
%~ DeepDyve