%0 Journal Article
%T Electrostatic discharge: mechanisms, protection techniques and effects on integrated circuit reliability
%A Avery, L. R.
%J Quality and Reliability Engineering International
%V 1
%N 2
%P 119-124
%@ 0748-8017
%D 1985-01-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve