%0 Journal Article
%T Design of data acquisition node circuit test board
%A Zhang, Jianyu
%A Wang, Rui
%A Liu, Baojun
%J Proceedings of SPIE
%V 13555
%P 135550Y-135550Y-5
%@ 0277-786X
%D 2025-04-18
%I SPIE
%~ DeepDyve