%0 Journal Article
%T Novel Method of Intrinsic Characteristic Extraction in Lightly Doped Drain Metal Oxide Semiconductor Field Effect Transistors for Accurate Device Modeling
%A Tada, Kenshi
%A Matsuoka, Toshimasa
%A Taniguchi, Kenji
%A Maeda, Kazuhiro
%A Sakai, Tamotsu
%A Kubota, Yasushi
%A Imai, Shigeki
%J Japanese Journal of Applied Physics
%V 43
%N 3R
%@ 0021-4922
%D 2004-03-01
%~ DeepDyve