%0 Journal Article
%T Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current
%A Kushida, Takuya
%A Tanaka, Shigeyasu
%A Morita, Chiaki
%A Tanji, Takayoshi
%A Ohshita, Yoshio
%J Journal of Electron Microscopy
%V 61
%N 5
%P 293-298
%@ 2050-5698
%D 2012-06-20
%I Oxford University Press
%~ DeepDyve