%0 Journal Article
%T Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification
%A Li, Tung-Yen
%A Tsai, Jang-Zern
%A Chang, Rong-Seng
%A Ho, Li-Wei
%A Yang, Ching-Fu
%A ,
%J IEEE Transactions on Industrial Electronics
%V 60
%N 9
%P 3976-3982
%@ 0278-0046
%D 2013-09-01
%I Institute of Electrical and Electronics Engineers (IEEE)
%~ DeepDyve