%0 Journal Article
%T Interfacial Characterizations of a Nickel-Phosphorus Layer Electrolessly Deposited on a Silane Compound-Modified Silicon Wafer Under Thermal Annealing
%A Lai, Kuei-Chang
%A Wu, Pei-Yu
%A Chen, Chih-Ming
%A Wei, 
Tzu-Chien
%A Wu, Chung-Han
%A Feng, Shien-Ping
%J Journal of Electronic Materials
%V 45
%N 10
%P 4813-4822
%@ 0361-5235
%D 2016-06-15
%I Springer US
%~ DeepDyve