%0 Journal Article
%T Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division
%A Yamaguchi, Takahiro
%A Ishida, Masahiro
%A Soma, Mani
%A Malarsie, Louis
%A Musha, Hirobumi
%J Journal of Electronic Testing
%V 19
%N 2
%P 183-193
%@ 0923-8174
%D 2004-10-05
%I Kluwer Academic Publishers
%~ DeepDyve