%0 Journal Article
%T Statistical variability of physically localized interface traps in SOI n-p-n DG TFETs
%A Lahkar, Himangshu
%A Medhi, Anurag
%A Deb, Deepjyoti
%A Saha, Rajesh
%A Baruah, Ratul Kr.
%A Goswami, Rupam
%J Journal of Materials Science: Materials in Electronics
%V 36
%N 6
%@ 0957-4522
%D 2025-02-01
%I Springer US
%~ DeepDyve