%0 Journal Article
%T Total ionizing dose effect modeling method for CMOS digital-integrated circuit
%A Liang, Bo
%A Liu, Jin-Hui
%A Zhang, Xiao-Peng
%A Liu, Gang
%A Tan, Wen-Dan
%A Zhang, Xin-Dan
%J Nuclear Science and Techniques
%V 35
%N 2
%@ 1001-8042
%D 2024-02-01
%I Springer Nature Singapore
%~ DeepDyve