%0 Journal Article
%T Measurement of the noise parameters of semiconductor devices
%A Gorlov, M.
%A Smirnov, D.
%A Anufriev, D.
%J Measurement Techniques
%V 49
%N 12
%P 1241-1245
%@ 0543-1972
%D 2006-03-21
%I Kluwer Academic Publishers-Consultants Bureau
%~ DeepDyve