%0 Journal Article
%T Verification of coarse-grained reconfigurable arrays through random test programs
%A Egger, Bernhard
%A Song, Eunjin
%A Lee, Hochan
%A Shin, Daeyoung
%J ACM SIGPLAN Notice
%V 53
%N 6
%P 76-88
%@ 0362-1340
%D 2018-06-19
%I ACM
%~ DeepDyve