%0 Journal Article
%T Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations
%A Das, Debaleena
%A Karpovsky, Mark
%J Journal of Electronic Testing
%V 10
%N 3
%P 215-229
%@ 0923-8174
%D 2004-09-09
%I Kluwer Academic Publishers
%~ DeepDyve