%0 Journal Article
%T A SLvT Adaptive Test Method for Integrated Circuit Test Parameter Sets without Yield Loss
%A Wu, Qiong
%A Hao, kaiming
%A Zhan, Wenfa
%J Journal of Electronic Testing
%V 40
%N 6
%P 777-793
%@ 0923-8174
%D 2024-12-01
%I Springer US
%~ DeepDyve