%0 Journal Article
%T Modified Ramped Current Stress Technique for Monitoring Thin Dielectrics Reliability and Charge Degradation
%A Andreev, Dmitrii V.
%A Maslovsky, Vladimir M.
%A Andreev, Vladimir V.
%A Stolyarov, Alexander A.
%J Physica Status Solidi (A) Applications and Materials Science
%V 219
%N 9
%@ 1862-6300
%D 2022-05-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve