%0 Journal Article
%T Application of AI failure identification techniques in condition monitoring using wavelet analysis
%A Gattino, Cecilia
%A Ottonello, Elia
%A Baggetta, Mario
%A Razzoli, Roberto
%A Stecki, Jacek
%A Berselli, Giovanni
%J The International Journal of Advanced Manufacturing Technology
%V 125
%N 9-10
%P 4013-4026
%@ 0268-3768
%D 2023-04-01
%I Springer London
%~ DeepDyve