%0 Journal Article
%T Behavioral VHDL-AMS model and experimental validation of a nuclear magnetic resonance sensor
%A Megherbi, S.
%A Ginefri, J.-C.
%A Darrasse, L.
%A Raynaud, G.
%A Pône, J.-F.
%J Microsystem Technologies
%V 12
%N 2
%P 38-43
%@ 0946-7076
%D 2005-11-23
%I Springer-Verlag
%~ DeepDyve