%0 Journal Article
%T Remote measurements system for applications in photonic materials characterization
%A Lesiak, P.
%A Burska, I.
%A Sitnik, R.
%J Proceedings of SPIE
%V 7120
%N 1
%P 71200S-71200S-9
%@ 0277-786X
%D 2008-06-30
%I SPIE
%~ DeepDyve