%0 Journal Article
%T 70 nm Silicon-Oxide-Nitride-Oxide-Silicon Nonvolatile Memory Devices Using Fowler-Nordheim Programming and Hot Hole Erase Method
%A Chae, Soodoo
%A Lee, Changju
%A Kim, Juhyung
%A Sung, Sukkang
%A Sim, Jaeseong
%A Kim, Moonkyung
%A Yoon, Sewook
%A Jeong, Younseok
%A Ryu, Wonil
%A Kim, Taehun
%A Park, Byung-Gook
%A Lee, Jo-won
%A Kim, Chungwoo
%J Japanese Journal of Applied Physics
%V 43
%N 4S
%@ 0021-4922
%D 2004-04-01
%~ DeepDyve