%0 Journal Article
%T High temperature behavior of multi-region direct current current–voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal–oxide–semiconductor field-effect-transistors reliability
%A He, Yandong
%A Zhang, Ganggang
%A Zhang, Xing
%J Japanese Journal of Applied Physics
%V 53
%N 4S
%P 4
%@ 0021-4922
%D 2014-01-01
%~ DeepDyve