%0 Journal Article
%T Voltage division investigation of series short‐circuit fault on SiC MOSFETs and Si IGBTs
%A Jingwei, Zhang
%A Qiang, Wang
%A Weifeng, Zhang
%A Guojun, Tan
%J IET Power Electronics
%V 16
%N 2
%P 333-345
%D 2023-02-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve