%0 Journal Article
%T Deep Convolutional Generative Adversarial Networks-Based Data Augmentation Method for Classifying Class-Imbalanced Defect Patterns in Wafer Bin Map
%A Park, Sangwoo
%A You, Cheolwoo
%J Applied Sciences
%V 13
%N 9
%@ 2076-3417
%D 2023-04-28
%I Multidisciplinary Digital Publishing Institute
%~ DeepDyve