%0 Journal Article
%T Reliability Express Control of the Gate Dielectric of Semiconductor Devices
%A Solodukha, V. A.
%A Chigir, G. G.
%A Pilipenko, V. A.
%A Filipenya, V. A.
%A Gorushko, V. A.
%A ,
%J Devices and Methods of Measurements
%@ 2220-9506
%D 2018-12-17
%I Belarusian National Technical University
%~ DeepDyve