%0 Journal Article
%T A compact, modular, multi-wavelength (200–850nm) rotating-analyzer ellipsometer for optical constant characterization of nanostructured materials
%A Agus Putra Dana, I Ketut
%A Jatmiko, Puthut Dwi
%A Suharyadi, Edi
%A Santoso, Iman
%J European Journal of Physics
%V 41
%N 6
%P 11
%@ 0143-0807
%D 2020-10-06
%~ DeepDyve