%0 Journal Article
%T Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures
%A Aleksejev, Igor
%A Devadze, Sergei
%A Jutman, Artur
%A Shibin, Konstantin
%J Journal of Electronic Testing
%V 32
%N 3
%P 245-255
%@ 0923-8174
%D 2016-04-28
%I Springer US
%~ DeepDyve