%0 Journal Article
%T New Built-In Self-Test Boundary Scan Architectures for Digital Integrated Circuits in Industrial Applications
%A H., Mohamed
%A Anas, Sherif
%A Waller, Winston
%A ,
%J International Journal of Computer Applications
%@ 0975-8887
%D 2018-07-16
%I Foundation of Computer Science
%~ DeepDyve