%0 Journal Article
%T Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes
%A Taylor, Roderick S.
%A Wendman, Mark A.
%J Proceedings of SPIE
%V 3009
%N 1
%P 119-129
%@ 0277-786X
%D 1997-04-15
%I SPIE
%~ DeepDyve