%0 Journal Article
%T A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing
%A Chien, Chen-Fu
%A Hsu, Chia-Yu
%J Journal of Intelligent Manufacturing
%V 17
%N 4
%P 429-439
%@ 0956-5515
%D 2005-12-05
%I Kluwer Academic Publishers
%~ DeepDyve