%0 Journal Article
%T 24.4: Investigation of Hot Carrier Degradation Due to AC Stress in Low Temperature Poly‐Si TFTs
%A Inoue, Satoshi
%A Kimura, Mutsumi
%A Shimoda, Tatsuya
%J Sid Symposium Digest of Technical Papers
%V 31
%N 1
%@ 0097-966X
%D 2000-05-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve