%0 Journal Article
%T Determination of conductor loss of multilayer‐coupled microstrip lines for CAD application
%A Verma, A. K.
%A Nasimuddin, A. K.
%J Microwave and Optical Technology Letters
%V 38
%N 5
%P 409-415
%@ 0895-2477
%D 2003-09-05
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve