%0 Journal Article
%T Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development
%A Vock, Stefan
%A Escalona, Omar
%A Turner, Colin
%J Journal of Electronic Testing
%V 31
%N 1
%P 107-117
%@ 0923-8174
%D 2014-11-19
%I Springer US
%~ DeepDyve