%0 Journal Article
%T Second‐order finite element method and its practical application in charged particle optics
%A ZHU, X.
%A MUNRO, E.
%J Journal of Microscopy
%V 179
%N 2
%P 170-180
%@ 0022-2720
%D 1995-01-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve