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References (3)
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A. Ikegami, H. Arima, H. Tosaki, Y. Matsuoka, Mitsuro Ai, H. Minorikawa, Y. Asahino (1980)
Thick-Film Thermistor and Its ApplicationsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 3
-
Nitya Vittal, R. Aiyer, C. Aiyer, M. Setty, R. Phadke, S. Karekar (1988)
Formulation of silver loaded manganite based thermistor paste and application of percolation theory for sudden transition in conductanceJournal of Applied Physics, 64
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H. Arima, A. Ikegami, H. Tosaki, M. Ai, Y. Matsuoka, T. Okayama (1981)
THICK FILM TEMPERATURE COMPENSATING CIRCUIT FOR SEMICONDUCTOR STRAIN GAUGESActive and Passive Electronic Components, 8
- Publisher
- Emerald Publishing
- Copyright
- Copyright © Emerald Group Publishing Limited
- ISSN
- 1356-5362
- DOI
- 10.1108/eb044568
- Publisher site
- See Article on Publisher Site
Abstract
This paper presents experimental data associated with the properties of thick film thermistors based on a spineltype semiconducting oxideRuO2glass system. The following parameterssheet resistivity, thermistor B and thermal time constantshave been measured, all as functions of different composition and construction variants. The thermistor properties are independent of configuration and are mainly determined by the semiconducting oxide particle chains. The correlation between B and for the compositions considered has been observed.
Journal
Microelectronics International – Emerald Publishing
Published: Feb 1, 1992