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Fast models for statistical processdevice simulation

Fast models for statistical processdevice simulation A new method for statistical processdevice modeling has been developed and applied to determine the impurty profiles and the currentvoltage characteristics of the pn junction. This method combines accurate numerical solutions of the transport equations with internally calibrated fast analytical semiempirical models. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Emerald Publishing

Fast models for statistical processdevice simulation

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References (1)

Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
0332-1649
DOI
10.1108/eb010115
Publisher site
See Article on Publisher Site

Abstract

A new method for statistical processdevice modeling has been developed and applied to determine the impurty profiles and the currentvoltage characteristics of the pn junction. This method combines accurate numerical solutions of the transport equations with internally calibrated fast analytical semiempirical models.

Journal

COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering – Emerald Publishing

Published: Apr 1, 1992

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