Access the full text.
Sign up today, get DeepDyve free for 14 days.
Loading next page...
/lp/emerald-publishing/the-application-of-machine-vision-to-ic-surface-inspection-KLJGK1jybH
References
References for this paper are not available at this time. We will be adding them shortly, thank you for your patience.
- Publisher
- Emerald Publishing
- Copyright
- Copyright © 2003 MCB UP Ltd. All rights reserved.
- ISSN
- 1598-2688
- DOI
- 10.1108/15982688200300019
- Publisher site
- See Article on Publisher Site
Abstract
During IC inspection, which includes the two parts of Mark and Lead, the deviation of IC on the tape occurring in high speed movements usually generates light reflection effect, which in turn causes errors in IC recognition as measured by machine vision system. this research filters the light reflection effect by developing standard components, identifies the correct position of IC Lead, hence fixes the measurement errors or non‐measurability caused by light reflection, avoids the resulting discontinued operation of measuring system, and improves the productivity.
Journal
Asian Journal on Quality – Emerald Publishing
Published: Aug 21, 2003
Keywords: Light reflection; Lead; Mark