Studying Shocked Material Dynamics with Ultrafast X-rays

Sandberg, R.L.; Bolme, C.; Ramos, K.; McCulloch, Q.; Martinez, R.; Hamilton, V.; Pierce, T.; Greenfield, M.; McGrane, S.; Barber, J.L.; Abbey, B.; Schropp, A.; Seiboth, F.; Heiman, P.; Nagler, B.; Galtier, E.; Granados, E.

Microscopy and MicroanalysisAug 1, 2015

Studying Shocked Material Dynamics with Ultrafast X-rays

Sandberg, R.L.;Bolme, C.;Ramos, K.;McCulloch, Q.;Martinez, R.;Hamilton, V.;Pierce, T.;Greenfield, M.;McGrane, S.;Barber, J.L.;Abbey, B.;Schropp, A.;Seiboth, F.;Heiman, P.;Nagler, B.;Galtier, E.;Granados, E.;

Microscopy and Microanalysis, 1 – Aug 1, 2015

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