Origin of Ferroelectricity in Thin Film HfO2 Probed by Revolving STEM and PACBED
Origin of Ferroelectricity in Thin Film HfO2 Probed by Revolving STEM and PACBED
Sang, Xiahan;Grimley, Everett D.;Schenk, Tony;Schroeder, Uwe;LeBeau, James M.
Microscopy and Microanalysis, 1 – Aug 1, 2015
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