Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL

Das, Sunil; Jin, Liwu; Assaf, Mansour; Biswas, Satyendra; Petriu, Emil

World Journal of EngineeringDec 1, 2012

Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL - Part 1

Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL - Part 2

Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL - Part 3

Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL - Part 4

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