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Component removal for rework and repair is traditionally achieved by re‐melting of the solder, but the exposure of the assembly or its component parts to repeated soldering/ desoldering cycles may cause both immediate damage and create a significant long term reliability hazard. Rework is labour...
Most of the electronics packaging materials, especially solders, are temperature dependent. Their temperature‐dependent material properties can be obtained by TMA (thermal mechanical analysis), DMA (dynamic mechanical analysis), DSC (differential scanning calorimetry), and TGA (thermogravimetric...
The rapid progress of ball grid array (BGA) component technology has served to alleviate many problems associated with the placement and soldering of high lead count, fine pitch surface mount technology (SMT) packages. An unfortunate result of this process, however, is the occurrence of voids in...
SIR testing is in practice carried out under a wider range of experimental conditions than those detailed in standards. The work presented here explores some of the issues when using a range of fluxes with various processing conditions and also examines the influence of substrate finish, test...
To achieve integration of chip scale package (CSP) devices into main stream surface mount technology (SMT) assembly, various experiments have been required. In process development, experiences learned from flip chip attach and ball grid array (BGA) assembly were utilized. Key process parameters...
A very common method to predict the reliability of components soldered on printed circuit board (PCB) or substrates is by bending tests and temperature cycle tests, for instance between ‐55°C and 125°C (up to 2,000 cycles at 1h cycle period). Sensitive SMD constructions such as chips with ball...
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