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Dielectric‐coated metallic waveguides with diameters of 4–8 mm and a length of 1 m have been efficiently fabricated with small transmission losses by using a method of electrodeposition of germanium.
An analysis is presented which has application to the magnetic brush method of development in an electrophotographic process. In this analysis, the stability of a collection of bead‐chains in a nonuniform magnetic field is examined from the point of view of minimizing the potential energy of...
A new procedure for molecular‐beam epitaxy growth is proposed in order to obtain a flat atomic layer without surface steps. The adsorption and desorption of Ga atoms on an InP substrate were studied by measuring the Auger electron peak intensities. It was found that the excess Ga atoms (surface...
We report an application of nuclear magnetic resonance (NMR) spectroscopy to the study of fluorine‐doped silicate glass prepared by the modified chemical vapor deposition process, prior to drawing the rod into fibers. The silica contains 1.03‐wt. % fluorine, as determined by the calibrated...
This report describes the first demonstration of thermal diffusivity measurements using picosecond transient thermoreflectance (TTR). Although previously reported methods of measuring thermal transport properties of thin films require precise knowledge of the thermal properties of the substrate,...
The buildup of interface states in Al–SiO 2 –Si metal‐oxide‐semiconductor capacitors following exposure to pulsed electron‐beam irradiation has been previously shown to be a two‐stage process. In the present work, we further examined the buildup by varying the field across the oxide...
Polarized anisotropic photoluminescence spectra are presented for the 4 F −4 3/2 I 1 1 / 2 transitions of YA1O 3 :Nd 3 + and for the 4 S 3 / 2 – 4 I 9 / 2 transitions of YAlO 3 :Er 3 + . It is shown that differences in the individual linewidth are caused by different degrees of resonance...
We report the first use of laser‐induced photo‐Hall techniques to investigate shallow and deep levels in n ‐InSb. From these measurements we show that photo‐Hall techniques provide a very sensitive measure of the photoinduced changes in the free‐electron concentration of InSb due to...
This paper describes the influence of deliberately applied scribe damage on pits formed in (001) Si wafers by immersion in a hydrofluoric acid solution. Immersion caused dense pitting, which correlates with stacking faults. However, a pit‐poor region appears in the strained vicinity of the...
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