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An adapter has been developed which allows a conventional electron microscope to be used interchangeably as an electron diffraction camera or an electron microscope. The adapter comprises a unit which takes the place of the projection lens unit of the microscope, and includes a newly designed...
This paper covers the general methods employed in mass spectrometry, machine design, and possible sources of error in relative‐abundance measurements which are inherently associated with instrument design. Also included are graphs for determining the critical constants of the usual types of...
The variation of refractive power and spherical aberration with electrode voltages and field strengths is studied for two characteristic unipotential lenses, an immersion lens, and a magnetic lens. Conclusions are drawn herefrom regarding the variation, with lens strength and applied voltage, of...
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