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RAD is an interactive computer program for radial distribution analysis of X‐ray diffraction data from amorphous materials. RAD has been written in Fortran 77 and runs on IBM PC/XT/AT or compatible computers.
A mechanical model is presented for the calculation of the stress depth distribution and the curvature radius in multilayer crystalline structures. The model is compatible with the perpendicular strain and thickness determined for each lamella by simulation of a double‐crystal X‐ray rocking...
Following the discovery of systems with diffraction patterns exhibiting icosahedral symmetry by Shechtman, Blecht, Gratias & Cahn (Phys. Rev. Lett. (1984), 53, 1951–1953), which is forbidden in classical crystallography, interest has centred on Penrose tiling and its generalizations as a model...
Two time‐of‐flight powder diffractometers have operated at the Intense Pulsed Neutron Source (IPNS) since August 1981. These instruments use dedicated microcomputers to focus time‐of‐flight events so that data from different detectors can be summed into a single histogram. Thus, large...
For high‐ or low‐temperature single‐crystal X‐ray data collection, the glues used to bind crystals to silica rods may induce strong modifications of the intensities. When an yttrium iron garnet (YIG) crystal was cooled, reflections which were equivalent at room temperature became...
When a one‐dimensional position‐sensitive proportional counter (PSPC) is employed in a small‐angle X‐ray scattering (SAXS) system, detector‐related problems might be encountered, such as nonuniformity of the detector, resolution function defined by the geometry of the receiving slit...
General strategies are described to obtain crystals of low‐molecular‐weight compounds suitable for X‐ray structure determination. A survey is given of a variety of crystallization techniques together with their advantages and drawbacks, illustrated by experiences with notoriously...
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