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A technique for the measurement of diffuse X‐ray scattering by a combination of an energy‐dispersive detector and a source of white X‐rays is described by taking the instrumental resolution into account. A high‐power X‐ray generator was used to generate white X‐rays. The...
The rare‐earth n‐butyrate dihydrates Ln(C4H7O2)3.2H2O (where Ln = Nd, Tb, Ho, Er, Tm, Yb or Y) were synthesized and the structural parameters determined employing X‐ray powder diffraction techniques. The salts are isomorphous and possess monoclinic symmetry with space group P21/m and...
A convenient approximation has been obtained for the intensity of the small‐angle X‐ray or neutron scattering from an assembly of independently scattering spherical particles with constant density when the radius‐distribution function is a Gaussian with a full width at half maximum which is...
It is shown by a diffraction technique that 2‐naphthalenethiol (C10H8S) undergoes a first‐order phase transition which occurs at 313 ± 0.5 K. The low‐temperature form III is ordered whereas the high‐temperature one I is disordered and may be kept as metastable far below 313 K. Thermal...
The energy‐dispersive X‐ray diffraction method has been used to measure integrated Bragg intensities from TaDx single crystals as a function of D concentration and scattering vector. The observed attenuation can be described in terms of a thermal and a static Debye–Waller factor (DWF). From...
A computer program for unambiguous and consistent indexing of a series of single‐crystal diffraction patterns is discussed which allows determination of the unit triangle and therefore tilting of the specimen into any special orientation even if no Kikuchi patterns can be observed.
The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X‐rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with...
Several procedures for Fourier analysis of single diffraction peaks for microstrains and mosaic sizes are compared. A simple new method works well, especially when the size distribution is broad, and/or when the strains vary in an unusual manner.
The vertical intensity distributions of X‐rays from a synchrotron source are measured by powder diffraction. The components polarized in the orbital plane and perpendicular to this plane are separated by measuring a reflection 90° to the vertical and horizontal planes, respectively. The...
A new direct‐methods computer program, MITHRIL, is described. Written in a neutral subset of Fortran IV, it is built around a heavily modified MULTAN80 system. It incorporates many recent theoretical developments in direct methods including the use of quartet and quintet invariants, a new...
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