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In the Rietveld method of analysing powder diffraction data, the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile. There is no intermediate step of extracting structure factors. The method was applied first to diffraction patterns...
Long‐range, elastic strains emanating from stress raisers, such as holes and inclusions, were investigated in bent silicon crystals which functioned as a model material. The strains and strain interactions were characterized by X‐ray Pendellösung fringe topography and were quantitatively...
Reflection profile functions used or suggested for use in Rietveld refinements with fixed‐angle or fixed‐wavelength powder diffraction data, obtained with neutrons or with X‐rays, are reviewed briefly. The fixed‐wavelength X‐ray case is considered in detail. In tests of fitting to...
A high‐temperature (~ 1070 K) tensile stage operating under controlled atmosphere convenient for X‐ray synchrotron topography is described. Early results of in situ measurements of dislocation velocities in silicon and an observation of dislocations expanding from the tip of a crack under...
A program is described to allow the dynamic graphic manipulation of molecules on a Tektronix 4054 graphics system. The program is useful for structure examination during X‐ray crystal structure solution and for visualizing the results of structure determinations.
Stereo‐diagrams of crystal structures are quickly produced and easily examined with interactive computer, graphics. The viewer can rotate, scale, edit, search and mark the drawing in real time. This gives the image an extra dimension over static, hard‐copy plots and facilitates the analysis...
X‐ray powder diffractometry has been used for the kinetic study of autoxidation by atmospheric oxygen of synthetic carotenoids at different temperatures (heterogeneous reactions). Peak intensity of a selected diffraction maximum was chosen as a kinetic variable. The results found for...
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