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A simple computer program for the simulation and analysis of X-ray back-reflection Laue photographs of a single crystal with any structure and orientation has been developed in Fortran IV. Comparison of computer plots of the calculated patterns with the photographs enables rapid identification of...
Probability functions, moments and cumulative distributions of the normalized intensity z = |E|2, depending on the space-group symmetry of the crystal and its chemical composition, have been investigated. The probability functions were reduced to a simple, unified representation, by reconsidering...