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- Publisher
- Wiley
- Copyright
- Copyright © 2008 Wiley Subscription Services, Inc., A Wiley Company
- ISSN
- 1600-5767
- eISSN
- 1600-5767
- DOI
- 10.1107/S0021889808000733
- Publisher site
- See Article on Publisher Site
Abstract
A general treatment of X‐ray imaging contrast for ultra‐small‐angle X‐ray scattering (USAXS) imaging is presented; this approach makes use of phase propagation and dynamical diffraction theory to account quantitatively for the intensity distribution at the detector plane. Simulated results from a model system of micrometre‐sized spherical SiO2 particles embedded in a polypropylene matrix show good agreement with experimental measurements. Simulations by means of a separate geometrical ray‐tracing method also account for the features in the USAXS images and offer a complementary view of small‐angle X‐ray scattering as a contrast mechanism. The ray‐tracing analysis indicates that refraction, in the form of Porod scattering, and, to a much lesser extent, X‐ray reflection account for the USAXS imaging contrast.
Journal
Journal of Applied Crystallography – Wiley
Published: Apr 1, 2008